Inside the New TOEIC Exam : your step-by-step guide to scoring higher Metre, Donald Van
Material type:
TextPublication details: New York, NY : Kaplan Publishing, c2008.Edition: 2nd edDescription: xii, 227 p. ; 17 cm illISBN: - 9781427797810
- M 428.0076 M594 2008
- PE 1128 .M594 2008
| Item type | Current library | Call number | Copy number | Status | Barcode | |
|---|---|---|---|---|---|---|
|
|
College Library General Circulation Section | PE 1128 .M594 2008 (Browse shelf(Opens below)) | 1 | Available | C14943 |
1210L-1700L
1
1
There are no comments on this title.