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Application of the Liu and Murakami damage model for artificial intelligence and intelligent information systems

Application of the Liu and Murakami damage model for artificial intelligence and intelligent information systems Hyde, Christopher J.; Sun, Wei; Hyde, Thomas H.; Saber, Mohammed; Becker, Adib A. - 2015 - Book title: Artificial intelligence and integrated intelligent information systems--Acession number C20552; pages 257-286

Subjects--Topical Terms:
INTELLIGENT INFORMATION SYSTEMS

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Application of the Liu and Murakami damage model for artificial intelligence and intelligent information systems

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