Application of the Liu and Murakami damage model for artificial intelligence and intelligent information systems Hyde, Christopher J.; Sun, Wei; Hyde, Thomas H.; Saber, Mohammed; Becker, Adib A.
Material type:
TextPublication details: 2015Description: Book title: Artificial intelligence and integrated intelligent information systems--Acession number C20552; pages 257-286Subject(s):
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Book Chapter
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College Library | Available |
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